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DAC
2003
ACM
16 years 7 months ago
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
WWW
2007
ACM
16 years 7 months ago
A fault model and mutation testing of access control policies
To increase confidence in the correctness of specified policies, policy developers can conduct policy testing by supplying typical test inputs (requests) and subsequently checking...
Evan Martin, Tao Xie
ICSE
2009
IEEE-ACM
16 years 1 months ago
Test selection for result inspection via mining predicate rules
It is labor-intensive to manually verify the outputs of a large set of tests that are not equipped with test oracles. Test selection helps to reduce this cost by selecting a small...
Wujie Zheng, Michael R. Lyu, Tao Xie
DATE
2009
IEEE
106views Hardware» more  DATE 2009»
16 years 1 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
ATAL
2009
Springer
16 years 1 months ago
Evolutionary testing of autonomous software agents
A system built in terms of autonomous agents may require even greater correctness assurance than one which is merely reacting to the immediate control of its users. Agents make su...
Cu D. Nguyen, Anna Perini, Paolo Tonella, Simon Mi...