21183 search results - page 253 / 4237 » Adaptive Testing by Test |
148
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
186
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ICCAD
1997
IEEE
15 years 10 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
159
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VTS
1997
IEEE
15 years 10 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
156
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
143
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ICSE
1997
IEEE-ACM
15 years 10 months ago
1997
IEEE-ACM
Testing methods are compared in a model where program failures are detected and the software changed to eliminate them. The question considered is whether it is better to use test...