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ATS
2003
IEEE
93views Hardware» more  ATS 2003»
15 years 11 months ago
Optimal System-on-Chip Test Scheduling
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
Erik Larsson, Hideo Fujiwara
ATS
2003
IEEE
105views Hardware» more  ATS 2003»
15 years 11 months ago
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...
ATS
2003
IEEE
112views Hardware» more  ATS 2003»
15 years 11 months ago
Domain Testing Based on Character String Predicate
Domain testing is a well-known software testing technique. Although research tasks have been initiated in domain testing, automatic test data generation based on character string ...
Ruilian Zhao, Michael R. Lyu, Yinghua Min
HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
15 years 11 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
ITC
2003
IEEE
97views Hardware» more  ITC 2003»
15 years 11 months ago
A Generic Test Path and DUT Model for DataCom ATE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
Jie Sun, Mike Li