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DATE
2005
IEEE
204views Hardware» more  DATE 2005»
16 years 4 days ago
Evaluation of Error-Resilience for Reliable Compression of Test Data
This paper addresses error-resilience as the capability to tolerate bit-flips in a compressed test data stream (which is transferred from an Automatic Test Equipment (ATE) to the...
Hamidreza Hashempour, Luca Schiano, Fabrizio Lomba...
DATE
2005
IEEE
99views Hardware» more  DATE 2005»
16 years 4 days ago
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
Irith Pomeranz, Sudhakar M. Reddy
ISNN
2005
Springer
16 years 21 hour ago
Non-parametric Statistical Tests for Informative Gene Selection
This paper presents two non-parametric statistical test methods, called Kolmogorov-Smirnov (KS) and U statistic test methods, respectively, for informative gene selection of a tumo...
Jinwen Ma, Fuhai Li, Jianfeng Liu
ACMSE
2004
ACM
15 years 12 months ago
Specification-driven automated testing of GUI-based Java programs
This paper presents a specification-driven approach to test automation for GUI-based JAVA programs as an alternative to the use of capture/replay. The NetBeans Jemmy library provi...
Yanhong Sun, Edward L. Jones
GECCO
2004
Springer
197views Optimization» more  GECCO 2004»
15 years 12 months ago
Applying Evolutionary Testing to Search for Critical Defects
Software systems are used regularly in safety-relevant applications. Therefore, the occurrence of critical defects may not only cause costly recalls but may also endanger human liv...
André Baresel, Harmen Sthamer, Joachim Wege...