21183 search results - page 242 / 4237 » Adaptive Testing by Test |
148
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DATE
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper proposes a comprehensive model for test planning in a core-based environment. The main contribution of this work is the use of several types of TAMs and the considerati...
169
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ICTAI
2002
IEEE
15 years 11 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
158
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DATE
1999
IEEE
15 years 10 months ago
1999
IEEE
In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary ports of the Integrate...
132
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ITC
1999
IEEE
15 years 10 months ago
1999
IEEE
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...
177
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ATS
1996
IEEE
15 years 10 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...