—Data dependence analysis techniques are the main component of today’s strategies for automatic detection of parallelism. Parallelism detection strategies are being incorporate...
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
Developer testing is a type of testing where developers test their code as they write it, as opposed to testing done by a separate quality assurance organization. Developer testin...
Tao Xie, Jonathan de Halleux, Nikolai Tillmann, Wo...
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik...