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COMPSAC
2003
IEEE
15 years 11 months ago
Data-Flow-Based Unit Testing of Aspect-Oriented Programs
The current research so far in aspect-oriented software development is focused on problem analysis, software design, and implementation techniques. Even though the importance of s...
Jianjun Zhao
ICSM
2003
IEEE
15 years 11 months ago
DART: A Framework for Regression Testing "Nightly/daily Builds" of GUI Applications
“Nightly/daily building and smoke testing” have become widespread since they often reveal bugs early in the software development process. During these builds, software is comp...
Atif M. Memon, Ishan Banerjee, Nada Hashmi, Adithy...
VTS
2003
IEEE
119views Hardware» more  VTS 2003»
15 years 11 months ago
Test Data Compression Using Dictionaries with Fixed-Length Indices
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
Lei Li, Krishnendu Chakrabarty
ICECCS
2002
IEEE
85views Hardware» more  ICECCS 2002»
15 years 11 months ago
Fault Detection Effectiveness of Spathic Test Data
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
Jane Huffman Hayes, Pifu Zhang
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
15 years 10 months ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...