137 search results - page 16 / 28 » Adaptive Techniques for Improving Delay Fault Diagnosis |
145
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ICASSP
2008
IEEE
16 years 16 days ago
2008
IEEE
We propose a new low complexity and fast converging frequencydomain adaptive algorithm for sparse system identification. This is achieved by exploiting the MMax and SP tap-select...
140
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
175
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MICRO
2009
IEEE
16 years 22 days ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
152
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VTS
2005
IEEE
15 years 11 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...
183
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DAC
2006
ACM
15 years 8 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...