21430 search results - page 93 / 4286 » Abstract Effective Models |
135
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ICCAD
2003
IEEE
16 years 3 months ago
2003
IEEE
Carbon Nanotube Field-Effect Transistors (CNFETs) are being extensively studied as possible successors to CMOS. Novel device structures have been fabricated and device simulators ...
191
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DAC
2006
ACM
16 years 5 days ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
166
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DSN
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...
160
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HICSS
2007
IEEE
16 years 16 days ago
2007
IEEE
Facilitating the transfer of knowledge between knowledge workers represents one of the main challenges of knowledge management. Knowledge transfer instruments, such as the experie...