21430 search results - page 489 / 4286 » Abstract Effective Models |
168
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ISCAS
2006
IEEE
16 years 27 days ago
2006
IEEE
—On-die capacitances interact with the inductance and resistance of the power distribution network to supply electrical charge. A distributed model is generally required to analy...
176
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ISQED
2003
IEEE
16 years 4 days ago
2003
IEEE
The internal-switching induced simultaneous switching noise (SSN) is studied in the paper. Unlike ground bounce caused by driving off-chip loading, both power-rail and ground-rail...
160
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
135
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DT
2007
15 years 6 months ago
2007
This paper proposes a new heuristic approach to determine the input pattern that minimizes leakage currents of nanometer CMOS circuits during sleep mode considering stack and fano...
206
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FORTE
2010
15 years 8 months ago
2010
Abstract. The complexity of distributed algorithms, such as state machine replication, motivates the use of formal methods to assist correctness verification. The design of the for...