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ICCD
2003
IEEE
143views Hardware» more  ICCD 2003»
15 years 12 months ago
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
Ozgur Sinanoglu, Alex Orailoglu
CONCUR
2003
Springer
15 years 11 months ago
Multi-Valued Model Checking via Classical Model Checking
Multi-valued model-checking is an extension of classical model-checking to reasoning about systems with uncertain information, which are common during early design stages. The addi...
Arie Gurfinkel, Marsha Chechik
ICLP
2003
Springer
15 years 11 months ago
Concurrency, Time, and Constraints
Concurrent constraint programming (ccp) is a model of concurrency for systems in which agents (also called processes) interact with one another by telling and asking information in...
Frank D. Valencia
ICCD
1996
IEEE
170views Hardware» more  ICCD 1996»
15 years 10 months ago
Boolean Function Representation Based on Disjoint-Support Decompositions
The Multi-Level Decomposition Diagrams (MLDDs) of this paper are a canonical representation of Boolean functions expliciting disjoint-support decompositions. MLDDs allow the reduc...
Valeria Bertacco, Maurizio Damiani
CIE
2009
Springer
15 years 10 months ago
Functions Definable by Arithmetic Circuits
An arithmetic circuit is a labelled, directed, acyclic graph specifying a cascade of arithmetic and logical operations to be performed on sets of non-negative integers. In this pap...
Ian Pratt-Hartmann, Ivo Düntsch