Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
A multicarrier QAM modulator for the wideband code division multiple access (WCDMA) basestation has been designed. The multicarrier modulator performs pulse shaping filtering for ...
Although verification and simulation tools are always improving, the results they provide remain hard to analyze and interpret. On one hand, verification sticks to the functional ...
Steve Casselman, John Schewel, Christophe Beaumont
Abstract. One of the most important analysis problems of hybrid systems is the reachability problem. State of the art computational tools perform reachability computation for timed...
Gerardo Lafferriere, George J. Pappas, Sergio Yovi...
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...