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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 11 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
CONTEXT
2007
Springer
16 years 27 days ago
User Profiling with Hierarchical Context: An e-Retailer Case Study
In e-commerce applications, no systematic research has been provided to evaluate if the use of a detailed and rich contextual representation improves the user modeling predictive p...
Cosimo Palmisano, Alexander Tuzhilin, Michele Gorg...
MLG
2007
Springer
16 years 26 days ago
Inferring Vertex Properties from Topology in Large Networks
: Network topology not only tells about tightly-connected “communities,” but also gives cues on more subtle properties of the vertices. We introduce a simple probabilistic late...
Janne Sinkkonen, Janne Aukia, Samuel Kaski
WM
2003
15 years 8 months ago
Integration with Ontologies
: One of today’s hottest IT topics is integration, as bringing together information from different sources and structures is not completely solved. The approach outlined here wan...
Andreas Maier, Jessica Aguado, Amaia Bernaras, I&n...
ISMM
2009
Springer
16 years 1 months ago
A Directional Rouy-Tourin Scheme for Adaptive Matrix-Valued Morphology
In order to describe anisotropy in image processing models or physical measurements, matrix fields are a suitable choice. In diffusion tensor magnetic resonance imaging (DT-MRI),...
Luis Pizarro, Bernhard Burgeth, Michael Breuß...