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220
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DATE
2010
IEEE
16 years 6 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
196
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NLPRS
2001
Springer
15 years 11 months ago
2001
Springer
in machine translation, long sentences are usually assumed to be difficult to treat. The main reason is the syntactic ambiguity which increases explosively as a sentence become lo...
190
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ATS
2000
IEEE
15 years 11 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
157
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
187
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ISCAS
1999
IEEE
15 years 11 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...