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186
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ICECCS
2002
IEEE
15 years 12 months ago
2002
IEEE
This paper presents an approach for generating test data for unit-level, and possibly integration-level, testing based on sampling over intervals of the input probability distribu...
186
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FSEN
2007
Springer
15 years 11 months ago
2007
Springer
This paper deals with test case selection from axiomatic specifications whose axioms are quantifier-free first-order formulae. Test cases are modeled as ground formulae and any spe...
184
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DATE
2004
IEEE
15 years 10 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
235
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DFT
2005
IEEE
15 years 9 months ago
2005
IEEE
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
179
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LREC
2010
15 years 8 months ago
2010
This paper describes a new language resource of events and semantic roles that characterize real-world situations. Narrative schemas contain sets of related events (edit and publi...