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ATS
2009
IEEE
138views Hardware» more  ATS 2009»
16 years 1 months ago
Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu
BIRTHDAY
2009
Springer
16 years 1 months ago
Formal Grammars of Early Language
We propose to model the development of language by a series of formal grammars, accounting for the linguistic capacity of children at the very early stages of mastering language. T...
Shuly Wintner, Alon Lavie, Brian MacWhinney
ISSTA
2009
ACM
16 years 1 months ago
A formal analysis of requirements-based testing
The aim of requirements-based testing is to generate test cases from a set of requirements for a given system or piece of software. In this paper we propose a formal semantics for...
Charles Pecheur, Franco Raimondi, Guillaume Brat
ISCAS
2008
IEEE
133views Hardware» more  ISCAS 2008»
16 years 1 months ago
A hybrid self-testing methodology of processor cores
—Software-based self-test (SBST) is a promising new technology for at-speed testing of embedded processors in SoC systems. This paper introduces an effective and efficient new ho...
Tai-Hua Lu, Chung-Ho Chen, Kuen-Jong Lee
DATE
2007
IEEE
116views Hardware» more  DATE 2007»
16 years 1 months ago
Testable design for advanced serial-link transceivers
This paper describes a DfT solution for modern seriallink transceivers. We first summarize the architectures of the Crosstalk Canceller and the Equalizer used in advanced transcei...
Mitchell Lin, Kwang-Ting (Tim) Cheng