1177 search results - page 105 / 236 » A review of function modeling: Approaches and applications |
186
click to vote
MTDT
2003
IEEE
15 years 11 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
140
click to vote
ICDCS
2005
IEEE
16 years 12 hour ago
2005
IEEE
IT today is driven by the trend of increasing scale and complexity. Utility and Grid computing models, PlanetLab, and traditional data centers, are reaching the scale of thousands...
215
click to vote
SOCO
2010
Springer
15 years 4 months ago
2010
Springer
This paper presents an evolutionary algorithm for modeling the arrival dates in time-stamped data sequences such as newscasts, e-mails, IRC conversations, scientific journal artic...
192
click to vote
TEC
2010
15 years 1 months ago
2010
We propose a unified data modeling approach that is equally applicable to supervised regression and classification applications, as well as to unsupervised probability density func...
140
click to vote
ICML
2007
IEEE
16 years 7 months ago
2007
IEEE
We introduce a robust probabilistic approach to modeling shape contours based on a lowdimensional, nonlinear latent variable model. In contrast to existing techniques that use obj...