6652 search results - page 979 / 1331 » A perspective based approach to design |
170
click to vote
ICCAD
1999
IEEE
15 years 11 months ago
1999
IEEE
Deep submicron technology calls for new design techniques, in which wire and gate delays are accounted to have equal or nearly equal effect on circuit behaviour. Asynchronous spee...
174
Voted
ISCAS
1999
IEEE
15 years 11 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
143
click to vote
ICRA
1998
IEEE
15 years 11 months ago
1998
IEEE
Assembly is a fundamental issue in the volume production of products that include microscopic submillimeter parts. These parts are often fabricated in parallel at high density but...
141
click to vote
IDMS
1998
Springer
15 years 11 months ago
1998
Springer
As the popularity of the World Wide Web increases, the amount of traffic results in major congestion problems for the retrieval of data over wide distances. To react to this, user...
171
click to vote
ISCA
1997
IEEE
15 years 11 months ago
1997
IEEE
As processor architectures have increased their reliance on speculative execution to improve performance, the importance of accurate prediction of what to execute speculatively ha...