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ISBI
2006
IEEE
16 years 7 months ago
Assessing the accuracy of non-rigid registration with and without ground truth
We compare two methods for assessing the performance of groupwise non-rigid registration algorithms. One approach, which has been described previously, utilizes a measure of overl...
Roy Schestowitz, Carole J. Twining, Timothy F. Coo...
ICCAD
2002
IEEE
107views Hardware» more  ICCAD 2002»
16 years 3 months ago
Characteristic faults and spectral information for logic BIST
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...
Xiaoding Chen, Michael S. Hsiao
ICASSP
2007
IEEE
16 years 28 days ago
Wavelet Footprints and Sparse Bayesian Learning for DNA Copy Number Change Analysis
Alterations in the number of DNA copies are very common in tumor cells and may have a very important role in cancer development and progression. New array platforms provide means ...
Roger Pique-Regi, En-Shuo Tsau, Antonio Ortega, Ro...
ACIVS
2006
Springer
15 years 10 months ago
Robust Analysis of Silhouettes by Morphological Size Distributions
We address the topic of real-time analysis and recognition of silhouettes. The method that we propose first produces object features obtained by a new type of morphological operato...
Olivier Barnich, Sébastien Jodogne, Marc Va...
ANSOFT
1999
74views more  ANSOFT 1999»
15 years 6 months ago
On Coping with Real-Time Software Dynamic Inconsistency by Built-in Tests
In real-time systems, dynamic inconsistencies of software are hardly detected, diagnosed and handled. A built-in test (BIT) method is developed to cope with software dynamic incon...
Yingxu Wang, Graham King, Dilip Patel, Shushma Pat...