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170
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TAP
2010
Springer
126views Hardware» more  TAP 2010»
15 years 12 months ago
DyGen: Automatic Generation of High-Coverage Tests via Mining Gigabytes of Dynamic Traces
Unit tests of object-oriented code exercise particular sequences of method calls. A key problem when automatically generating unit tests that achieve high structural code coverage ...
Suresh Thummalapenta, Jonathan de Halleux, Nikolai...
ISSTA
1998
ACM
15 years 11 months ago
Automatic Test Data Generation Using Constraint Solving Techniques
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
Arnaud Gotlieb, Bernard Botella, Michel Rueher
164
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FPGA
1997
ACM
145views FPGA» more  FPGA 1997»
15 years 11 months ago
Generation of Synthetic Sequential Benchmark Circuits
Programmable logic architectures increase in capacity before commercial circuits are designed for them, yielding a distinct problem for FPGA vendors: how to test and evaluate the ...
Michael D. Hutton, Jonathan Rose, Derek G. Corneil
DAC
1996
ACM
15 years 11 months ago
Using Register-Transfer Paths in Code Generation for Heterogeneous Memory-Register Architectures
In this paper we address the problem of code generation for basic blocks in heterogeneous memory-register DSP processors. We propose a new a technique, based on register-transfer ...
Guido Araujo, Sharad Malik, Mike Tien-Chien Lee
AMOST
2007
ACM
15 years 11 months ago
Combining test case generation for component and integration testing
When integrating dierent system components, the interaction between dierent features is often error prone. Typically errors occur on interruption, concurrency or disabling/ enabli...
Sebastian Benz