8671 search results - page 245 / 1735 » A generator for hierarchical problems |
176
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GVD
2009
15 years 4 months ago
2009
In this paper, we present the current development progress of our dynamic insert strategy based on the Intelligent Cluster Index (ICIx), which is a new type of multidimensional da...
163
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KBSE
2002
IEEE
15 years 11 months ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...
191
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VLSID
1997
IEEE
15 years 10 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
166
Voted
KBSE
2002
IEEE
15 years 11 months ago
2002
IEEE
A design pattern encapsulates the knowledge of object-oriented designers into re-usable artifacts. A design pattern is a descriptive device that fosters software design re-use. Th...
177
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QSIC
2003
IEEE
15 years 12 months ago
2003
IEEE
In this paper, we consider a problem that arises in black box testing: generating small test suites (i.e., sets of test cases) where the combinations that have to be covered are s...