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161
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
175
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3DPVT
2002
IEEE
15 years 11 months ago
2002
IEEE
In many applications surfaces with a large number of primitives occur. Geometry compression reduces storage space and transmission time for such models. A special case is given by...
201
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AIPR
2002
IEEE
15 years 11 months ago
2002
IEEE
Conventional remote sensing classification techniques that model the data in each class with a multivariate Gaussian distribution are inefficient, as this assumption is generally ...
168
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DSD
2002
IEEE
15 years 11 months ago
2002
IEEE
Modern microprocessors schedule instructions dynamically in order to exploit instruction-level parallelism. It is necessary to increase instruction window size for improving instr...
198
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FOCS
2002
IEEE
15 years 11 months ago
2002
IEEE
Abstract—This paper generalizes the classical Knuth–Schönhage algorithm computing the greatest common divisor (gcd) of two polynomials for solving arbitrary linear Diophantine...