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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
16 years 7 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
VLSID
2001
IEEE
184views VLSI» more  VLSID 2001»
16 years 7 months ago
Battery Life Estimation of Mobile Embedded Systems
Since battery life directly impacts the extent and duration of mobility, one of the key considerations in the design of a mobile embedded system should be to maximize the energy d...
Debashis Panigrahi, Sujit Dey, Ramesh R. Rao, Kani...
HPCA
2008
IEEE
16 years 7 months ago
Automated microprocessor stressmark generation
Estimating the maximum power and thermal characteristics of a processor is essential for designing its power delivery system, packaging, cooling, and power/thermal management sche...
Ajay M. Joshi, Lieven Eeckhout, Lizy Kurian John, ...
HPCA
2003
IEEE
16 years 7 months ago
Dynamic Optimization of Micro-Operations
Inherent within complex instruction set architectures such as x86 are inefficiencies that do not exist in a simpler ISAs. Modern x86 implementations decode instructions into one o...
Brian Slechta, David Crowe, Brian Fahs, Michael Fe...
CHI
2004
ACM
16 years 7 months ago
Automatic support for web user studies with SCONE and TEA
This paper describes the concepts of TEA, a flexible tool that supports user tests by automating repetitive tasks and collecting data of user inputs and actions. TEA was specifica...
Hartmut Obendorf, Harald Weinreich, Torsten Hass
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