An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...
The ability to guarantee the functional correctness of digital integrated circuits and, in particular, complex microprocessors, is a key task in the production of secure and trust...
This paper presents an information retrieval methodology which uses Formal Concept Analysis in conjunction with semantics to provide contextual answers to users’ queries. User f...
In 1996 Ward et al reported the results of their UK study into the state of practice in evaluating and realizing benefits from IS/IT investments. This paper presents new empirical...
It is only recently that rational exchange schemes have been considered as an alternative solution to the exchange problem. A rational exchange protocol cannot provide fairness bu...