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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
16 years 6 months ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
WSC
2004
15 years 7 months ago
Visual Modeling of Business Problems: Workflow and Patterns
Computer-based business analysis relies on models, or algorithmic representations of the business process. Real-life business problems can become very complex, which creates diffi...
Lev Virine, Jason McVean
QEST
2007
IEEE
16 years 17 days ago
Performance Trees: Expressiveness and Quantitative Semantics
—Performance Trees are a recently-proposed mechanism for the specification of performance properties and measures. They represent an attractive alternative to stochastic logics,...
Tamas Suto, Jeremy T. Bradley, William J. Knottenb...
ISCAS
2006
IEEE
103views Hardware» more  ISCAS 2006»
16 years 9 days ago
A high-speed low-energy dynamic PLA using an input-isolation scheme
— Recently, there has been renewed interest in structured logic arrays due to a number of inherent advantages. However, before they will be more widely adopted, structured logic ...
Reza Molavi, Shahriar Mirabbasi, Resve A. Saleh
CHES
2005
Springer
80views Cryptology» more  CHES 2005»
15 years 12 months ago
Successfully Attacking Masked AES Hardware Implementations
During the last years, several masking schemes for AES have been proposed to secure hardware implementations against DPA attacks. In order to investigate the effectiveness of thes...
Stefan Mangard, Norbert Pramstaller, Elisabeth Osw...