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» A case study in test management
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VTS
2007
IEEE
129views Hardware» more  VTS 2007»
16 years 27 days ago
Supply Voltage Noise Aware ATPG for Transition Delay Faults
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
APLAS
2008
ACM
15 years 8 months ago
The Complexity of Coverage
Abstract. We study the problem of generating a test sequence that achieves maximal coverage for a reactive system under test. We formulate the problem as a repeated game between th...
Krishnendu Chatterjee, Luca de Alfaro, Rupak Majum...
COMCOM
2006
115views more  COMCOM 2006»
15 years 6 months ago
IPv6 deployment: Real time applications and QoS aspects
This paper gives an overview of the issues related to the QoS mechanisms under IPv6 and the transition of applications to the new Internet protocol. We describe the implementation...
Christos Bouras, Apostolos Gkamas, Dimitris Primpa...
ERCIMDL
2010
Springer
150views Education» more  ERCIMDL 2010»
15 years 7 months ago
A Search Log-Based Approach to Evaluation
Abstract. Anyone offering content in a digital library is naturally interested in assessing its performance: how well does my system meet the users' information needs? Standar...
Junte Zhang, Jaap Kamps
CSREAESA
2010
15 years 4 months ago
The First Clock Cycle Is A Real BIST
The primary goal of Built-In Self-Test (BIST) for Field Programmable Gate Arrays (FPGAs) is to completely test all programmable logic and routing resources in the device such that ...
Charles E. Stroud, Bradley F. Dutton