The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Abstract. We study the problem of generating a test sequence that achieves maximal coverage for a reactive system under test. We formulate the problem as a repeated game between th...
Krishnendu Chatterjee, Luca de Alfaro, Rupak Majum...
This paper gives an overview of the issues related to the QoS mechanisms under IPv6 and the transition of applications to the new Internet protocol. We describe the implementation...
Abstract. Anyone offering content in a digital library is naturally interested in assessing its performance: how well does my system meet the users' information needs? Standar...
The primary goal of Built-In Self-Test (BIST) for Field Programmable Gate Arrays (FPGAs) is to completely test all programmable logic and routing resources in the device such that ...