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EKAW
2006
Springer
15 years 10 months ago
Semantic Metrics
In the context of the Semantic Web, many ontology-related operations, e.g. ontology ranking, segmentation, alignment, articulation, reuse, evaluation, can reduced to one fundamenta...
Bo Hu, Yannis Kalfoglou, Harith Alani, David Duppl...
PPDP
2000
Springer
15 years 9 months ago
Symmetric monoidal sketches
We introduce and develop the notion of symmetric monoidal sketch. Every symmetric monoidal sketch generates a generic model. If the sketch is commutative and single-sorted, the gen...
Martin Hyland, John Power
EURODAC
1995
IEEE
142views VHDL» more  EURODAC 1995»
15 years 9 months ago
Prediction of radiated electromagnetic emissions from PCB traces based on green dyadics
Because it costs to solve ElectroMagnetic Compatibility (EMC) problems late in the development process, new methods have to predict radiated electromagnetic emissions at the desig...
E. Leroux, Flavio G. Canavero, G. Vecchi
ICCAD
1995
IEEE
167views Hardware» more  ICCAD 1995»
15 years 9 months ago
A novel methodology for statistical parameter extraction
IC manufacturing process variations are typically expressed in terms of joint probability density functions (jpdf’s) or as worst case combinations/corners of the device model pa...
Kannan Krishna, Stephen W. Director
ICPR
2010
IEEE
15 years 8 months ago
Improved Blur Insensitivity for Decorrelated Local Phase Quantization
This paper presents a novel blur tolerant decorrelation scheme for local phase quantization (LPQ) texture descriptor. As opposed to previous methods, the introduced model can be a...
Janne Heikkilä, Ville Ojansivu, Esa Rahtu