Multiprocessor SoC systems have led to the increasing use of parallel hardware along with the associated software. These approaches have included coprocessor, homogeneous processo...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shif...
eously demand shorter and less costly design cycles. Designing at higher levels of abstraction makes both objectives achievable, but enabling techniques like behavioral synthesis h...
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...