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JEC
2006
71views more  JEC 2006»
15 years 6 months ago
Destructive-read in embedded DRAM, impact on power consumption
This paper explores power consumption for destructive-read embedded DRAM. Destructive-read DRAM is based on conventional DRAM design, but with sense amplifiers optimized for lower ...
Haakon Dybdahl, Per Gunnar Kjeldsberg, Marius Gran...
JHSN
2006
95views more  JHSN 2006»
15 years 6 months ago
IPsec/VPN security policy correctness and assurance
: With IPSec/VPN policies being widely deployed, how to correctly specify and configure them is critical in enforcing security requirements. Under current practice, IPSec/VPN polic...
Yanyan Yang, Charles U. Martel, Zhi (Judy) Fu, Shy...
MJ
2008
148views more  MJ 2008»
15 years 6 months ago
Drive current boosting of n-type tunnel FET with strained SiGe layer at source
Though silicon tunnel field effect transistor (TFET) has attracted attention for sub-60 mV/decade subthreshold swing and very small OFF current (IOFF), its practical application i...
Nayan Patel, A. Ramesha, Santanu Mahapatra
JSAC
2006
93views more  JSAC 2006»
15 years 6 months ago
Performance Enhancement of On-Board Communication Networks Using Outage Prediction
Abstract--A research area that has become increasingly important in recent years is that of on-board mobile communication, where users on a vehicle are connected to a local network...
Adeel Baig, Lavy Libman, Mahbub Hassan
ET
2007
84views more  ET 2007»
15 years 6 months ago
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics
We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are prese...
Zhanglei Wang, Krishnendu Chakrabarty