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» A Transactional Architecture for Simulation
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VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
16 years 7 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
VLSID
2004
IEEE
114views VLSI» more  VLSID 2004»
16 years 7 months ago
High-Speed Optoelectronics Receivers in SiGe
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
Amit Gupta, Steven P. Levitan, Leo Selavo, Donald ...
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
16 years 7 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang
VLSID
2003
IEEE
167views VLSI» more  VLSID 2003»
16 years 7 months ago
Timing Minimization by Statistical Timing hMetis-based Partitioning
In this paper we present statistical timing driven hMetisbased partitioning. We approach timing driven partitioning from a different perspective: we use the statistical timing cri...
Cristinel Ababei, Kia Bazargan
VLSID
2003
IEEE
78views VLSI» more  VLSID 2003»
16 years 7 months ago
Interface Design Techniques for Single-Chip Systems
This paper quantifies the performance of typical functional unit interface designs in single-chip systems. We introduce a specific equation to guide the design of optimal module i...
Robert H. Bell Jr., Lizy Kurian John