Abstract A divide-and-conquer algorithm for computing the parametric yield of large analog circuits is presented. The algorithm targets applications whose performance spreads could...
Abstract - We address the problem of automatically verifying large digital designs at the logic level, against high-level specifications. In this paper, we present a methodology wh...
State-of-the-art automatic reliability analyses as used in system-level design approaches mainly rely on Binary Decision Diagrams (BDDs) and, thus, face two serious problems: (1) ...
In this work, we study the different buffering techniques used in the literature to solve the contention problem in A TM switching architectures. The objective of our study is to ...
—Wireless mesh networks (WMNs) have recently emerged to be a cost-effective solution to support large-scale wireless Internet access. One important component of realizing large-s...