4798 search results - page 382 / 960 » A Time for Change |
167
click to vote
ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
186
click to vote
ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
213
click to vote
ICASSP
2009
IEEE
16 years 1 months ago
2009
IEEE
In this paper, we address the problem of face tracking across illumination changes and occlusions. The method is based on leveraging the strengths of both Adaboost to deal with cl...
186
Voted
KBSE
2009
IEEE
16 years 1 months ago
2009
IEEE
—Developers often change software in ways that cause tests to fail. When this occurs, developers must determine whether failures are caused by errors in the code under test or in...
161
click to vote
P2P
2009
IEEE
16 years 1 months ago
2009
IEEE
ID uniqueness is essential in DHT-based systems as peer lookup and resource searching rely on IDmatching. Many previous works and measurements on Kad do not take into account that...