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A Test-Vector Generation Methodology for Crosstalk Noise Fau...
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A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
15 years 10 months ago
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In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb
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