Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
— One way to handle data mining problems where class prior probabilities and/or misclassification costs between classes are highly unequal is to resample the data until a new, d...
: This paper reports on the automatic metadata generation applications (AMeGA) project's metadata expert survey. Automatic metadata generation research is reviewed and the stu...
A new method for ensemble generation is presented. It is based on grouping the attributes in dierent subgroups, and to apply, for each group, an axis rotation, using Principal Com...
In this paper I describe how a significant class of cases that would involve (possibly complex) structural transfer in nmchine translation can be handled avoiding transfer. This i...