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DFT
2007
IEEE
141views VLSI» more  DFT 2007»
16 years 1 months ago
A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Gl...
DSD
2007
IEEE
105views Hardware» more  DSD 2007»
16 years 1 months ago
Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment
With continuing increase in soft error rates, its foreseeable that multiple faults will eventually need to be considered when modeling circuit sensitivity and evaluating faulttole...
Christian J. Hescott, Drew C. Ness, David J. Lilja
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
16 years 1 months ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
GLOBECOM
2007
IEEE
16 years 1 months ago
Ensemble Enumerators for Protograph-Based Generalized LDPC Codes
— Protograph-based LDPC codes have the advantages of a simple design (or search) procedure and highly structured encoders and decoders. These advantages have also been exploited ...
Shadi Abu-Surra, William E. Ryan, Dariush Divsalar
GLOBECOM
2007
IEEE
16 years 1 months ago
An Enhanced RFID Multiple Access Protocol for Fast Inventory
- The relevant performance metric for successful deployment of Radio Frequency Identification (RFID) systems for tag inventory applications is the latency for reading all tags with...
You-Chang Ko, Sumit Roy, Joshua R. Smith, Hyung-Wo...