1325 search results - page 189 / 265 » A Scaling Result for Explosive Processes |
158
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VLSID
2002
IEEE
16 years 6 months ago
2002
IEEE
Predictive delay analysis is presented for a representative CMOS inverter with submicron device size using PREDICTMOS MOSFET model. As against SPICE, which adopts a time consuming...
261
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VLDB
2007
ACM
16 years 6 months ago
2007
ACM
Abstract The notorious "dimensionality curse" is a wellknown phenomenon for any multi-dimensional indexes attempting to scale up to high dimensions. One well-known approa...
137
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ICSE
2007
IEEE-ACM
16 years 6 months ago
2007
IEEE-ACM
We present a software tool and a framework for security protocol change management. While we focus on trust negotiation protocols in this paper, many of the ideas are generally ap...
176
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PERCOM
2008
ACM
16 years 6 months ago
2008
ACM
As the scale of modern sensor networks continues to grow, energy consumption, scalability and routing efficiency are becoming key design challenges. Network management plays an im...
159
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ISQED
2010
IEEE
16 years 1 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...