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ICCD
2003
IEEE
143views Hardware» more  ICCD 2003»
15 years 12 months ago
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
Ozgur Sinanoglu, Alex Orailoglu
ISCAS
2003
IEEE
135views Hardware» more  ISCAS 2003»
15 years 11 months ago
Formal verification of LTL formulas for SystemC designs
To handle today’s complexity, modern circuits and systems be specified at a high level of abstraction. Recently, SystemC has been proposed as a language that allows a fast on o...
Daniel Große, Rolf Drechsler
CAEPIA
2003
Springer
15 years 11 months ago
A Framework for Ontology Reuse and Persistence Integrating UML and Sesame
Nowadays there is a great effort underway to improve the World Wide Web. A better content organisation, allowing automatic processing, leading to the Semantic Web is one of the mai...
Carlos Pedrinaci, Amaia Bernaras, Tim Smithers, Je...
ICVS
2003
Springer
15 years 11 months ago
Towards Ontology Based Cognitive Vision
This paper details a visual concept ontology driven knowledge acquisition methodology. We propose to use a visual concept ontology to guide experts in the visual description of the...
Nicolas Maillot, Monique Thonnat, Alain Boucher
DATE
2010
IEEE
129views Hardware» more  DATE 2010»
15 years 11 months ago
Block-level bayesian diagnosis of analogue electronic circuits
—Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue...
Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Han...