2762 search results - page 476 / 553 » A Quality Model for Evaluating Feature Models |
173
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TMI
2008
15 years 6 months ago
2008
Abstract--Due to the significant complexity of membrane morphology and the generally poor image quality in electron tomographic volumes, current automatic methods for segmentation ...
177
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TCAD
2002
15 years 6 months ago
2002
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
211
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ASAP
2011
IEEE
14 years 6 months ago
2011
IEEE
—The domain of vision and navigation often includes applications for feature tracking as well as simultaneous localization and mapping (SLAM). As these problems require computati...
150
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DAC
1998
ACM
16 years 7 months ago
1998
ACM
In this paper we present a new global router appropriate for Multichip Module MCM and dense Printed Circuit Board PCB design, which utilizes a hybrid of the classical rip-up and r...
199
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KDD
2007
ACM
16 years 6 months ago
2007
ACM
In some applications such as filling in a customer information form on the web, some missing values may not be explicitly represented as such, but instead appear as potentially va...