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» A Permutation Approach to Validation
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DATE
2000
IEEE
121views Hardware» more  DATE 2000»
15 years 11 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
ICRA
2000
IEEE
102views Robotics» more  ICRA 2000»
15 years 11 months ago
Visual Servoing from Lines
In this paper we present a new approach to visual servoing using lines. It is based on a theoretical and geometrical study of the main line representations which allows us to deļ¬...
Nicolas Andreff, Bernard Espiau, Radu Horaud
ICRA
2000
IEEE
144views Robotics» more  ICRA 2000»
15 years 11 months ago
Automatic Identification of Local Geometric Properties During Teleoperation
During teleoperation, a human operator often receives only 2-D visual feedback from the remote environment. While a variety of kinematic sensors exist on the remote manipulator fo...
Thomas Debus, Pierre E. Dupont, Robert D. Howe
ICRA
2000
IEEE
73views Robotics» more  ICRA 2000»
15 years 11 months ago
Environment Delay in Haptic Systems
This paper will investigate the influence environment delay has on haptic systems. Work presented in [9]and [ll]demonstrated that it is possible to account for environment delay (...
Brian E. Miller, J. Edward Colgate, Randy Freeman
163
Voted
ICSM
2000
IEEE
15 years 11 months ago
Recovering Class Diagrams from Data-Intensive Legacy Systems
Several reverse engineering methods for recovering objects from legacy systems have been proposed in the literature, but most of them neglect to identify the relationships among t...
Giuseppe A. Di Lucca, Anna Rita Fasolino, Ugo de C...