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MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
15 years 12 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
EDBT
2008
ACM
159views Database» more  EDBT 2008»
16 years 6 months ago
Automaton in or out: run-time plan optimization for XML stream processing
Many systems such as Tukwila and YFilter combine automaton and algebra techniques to process queries over tokenized XML streams. Typically in this architecture, an automaton is fi...
Hong Su, Elke A. Rundensteiner, Murali Mani
ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
16 years 3 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
VECPAR
2004
Springer
16 years 1 days ago
Distributed Processing of Large BioMedical 3D Images
The Human Genetics Unit (HGU) of the Medical Research Council (MRC) in Edinburgh has developed the Edinburgh Mouse Atlas, a spatial temporal framework to store and analyze biologic...
Konstantinos Liakos, Albert Burger, Richard A. Bal...
DAGSTUHL
2007
15 years 8 months ago
Image-Based Motion Compensation for Structured Light Scanning of Dynamic Surfaces
: Many structured light scanning systems based on temporal pattern codification produce dense and robust results on static scenes but behave very poorly when applied to dynamic sc...
Stefan Gumhold, Sören König