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DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
16 years 1 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
CSCWD
2006
Springer
15 years 10 months ago
Quantitative Evaluation of Workspace Collaboration
In this paper we propose an analytical approach based on models of human performance to evaluate workspace collaboration. Our results indicate that the approach: 1) facilitates th...
Antonio Ferreira, Pedro Antunes
CVPR
2001
IEEE
16 years 8 months ago
Component-based Face Detection
We present a component-based, trainable system for detecting frontal and near-frontal views of faces in still gray images. The system consists of a two-level hierarchy of Support ...
Bernd Heisele, Thomas Serre, Massimiliano Pontil, ...
HICSS
2006
IEEE
180views Biometrics» more  HICSS 2006»
16 years 23 days ago
Knowledge Dynamics in Regional Economies: A Research Framework
This paper addresses challenges associated with the dynamics of knowledge in clusters and regional networks. It develops a conceptual framework, a methodology and a research agend...
Ramon O'Callaghan, Rafel Andreu
ICDM
2006
IEEE
132views Data Mining» more  ICDM 2006»
16 years 23 days ago
Mining for Tree-Query Associations in a Graph
New applications of data mining, such as in biology, bioinformatics, or sociology, are faced with large datasets structured as graphs. We present an efficient algorithm for minin...
Eveline Hoekx, Jan Van den Bussche