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DFT
2006
IEEE
148views VLSI» more  DFT 2006»
15 years 8 months ago
Bilateral Testing of Nano-scale Fault-tolerant Circuits
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
Lei Fang, Michael S. Hsiao
DMSN
2005
ACM
15 years 8 months ago
The threshold join algorithm for top-k queries in distributed sensor networks
In this paper we present the Threshold Join Algorithm (TJA), which is an efficient TOP-k query processing algorithm for distributed sensor networks. The objective of a top-k query...
Demetrios Zeinalipour-Yazti, Zografoula Vagena, Di...
AIIA
2007
Springer
15 years 8 months ago
Tonal Harmony Analysis: A Supervised Sequential Learning Approach
We have recently presented CarpeDiem, an algorithm that can be used for speeding up the evaluation of Supervised Sequential Learning (SSL) classifiers. CarpeDiem provides impress...
Daniele P. Radicioni, Roberto Esposito
CLEF
2008
Springer
15 years 8 months ago
The Domain-Specific Track at CLEF 2008
The domain-specific track evaluates retrieval models for structured scientific bibliographic collections in English, German and Russian. Documents contain elements (title, abstrac...
Vivien Petras, Stefan Baerisch
CLEF
2008
Springer
15 years 8 months ago
Overview of the WikipediaMM Task at ImageCLEF 2008
The wikipediaMM task provides a testbed for the system-oriented evaluation of ad-hoc retrieval from a collection of Wikipedia images. It became a part of the ImageCLEF evaluation ...
Theodora Tsikrika, Jana Kludas
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