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EVOW
2008
Springer
15 years 8 months ago
Evolving an Automatic Defect Classification Tool
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Assaf Glazer, Moshe Sipper
WCE
2007
15 years 7 months ago
Image Enhancement Using Particle Swarm Optimization
Abstract—Applications of the Particle Swarm Optimization (PSO) to solve image processing problem with a reference to a new automatic enhancement technique based on real-coded par...
Malik Braik, Alaa F. Sheta, Aladdin Ayesh
KES
2008
Springer
15 years 6 months ago
On the use of spiking neural network for EEG classification
This paper presents a new classification technique of continuous EEG recordings, based on a network of spiking neurons. Human EEG signals published on the BCI Competition website w...
Piyush Goel, Honghai Liu, David J. Brown, Avijit D...
PR
2002
122views more  PR 2002»
15 years 6 months ago
High-order Fisher's discriminant analysis
This paper introduces a novel nonlinear extension of Fisher's classical linear discriminant analysis (FDA) known as high-order Fisher's discriminant analysis (HOFDA). Th...
Alejandro Sierra
ICPR
2010
IEEE
15 years 5 months ago
Data-Driven Lung Nodule Models for Robust Nodule Detection in Chest CT
The quality of the lung nodule models determines the success of lung nodule detection. This paper describes aspects of our data-driven approach for modeling lung nodules using the...
Amal Farag, James Graham, Aly A. Farag