371 search results - page 9 / 75 » A New Method for Interoperability Test Generation |
159
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DSD
2010
IEEE
15 years 4 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
145
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COMCOM
1999
15 years 5 months ago
1999
We present a problem of commonly used characterization sequences (CS) for the protocol conformance testing and propose a new test sequence to resolve the problem. The proposed tes...
184
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ITC
1993
IEEE
15 years 10 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
189
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ISSTA
1998
ACM
15 years 10 months ago
1998
ACM
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
155
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KBSE
2002
IEEE
15 years 10 months ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...