Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
ion of Assembler Programs for Symbolic Worst Case Execution Time Analysis Tobias Schuele Tobias.Schuele@informatik.uni-kl.de Klaus Schneider Klaus.Schneider@informatik.uni-kl.de Re...
We obtain analytically, the energy optimal speed profile of a generic multi-speed device with a discrete set of speeds, to execute a given task within a given time. Current implem...
Intrusion attempts due to self-propagating code are becoming an increasingly urgent problem, in part due to the homogeneous makeup of the internet. Recent advances in anomalybased...
Denver Dash, Branislav Kveton, John Mark Agosta, E...