2794 search results - page 238 / 559 » A New Architecture for Automated Modelling |
154
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DAC
2001
ACM
16 years 7 months ago
2001
ACM
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...
144
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
226
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Increasing resistivity of copper with scaling and rising demands on current density requirements are driving the need to identify new wiring solutions for deep nanometer scale VLS...
181
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
A novel method to solve the state encoding problem in Signal Transition Graphs is presented. It is based on the structural theory of Petri nets and can be applied to large specifi...
177
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
In this paper we present a new efficient algorithm for retiming sequential circuits with edge-triggered registers under both setup and hold constraints. Compared with the previous...