16518 search results - page 3103 / 3304 » A New Approach to Splitting-Off |
189
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
154
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DAC
1998
ACM
16 years 7 months ago
1998
ACM
In this paper we present a new global router appropriate for Multichip Module MCM and dense Printed Circuit Board PCB design, which utilizes a hybrid of the classical rip-up and r...
204
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Parametric representations used for symbolic simulation of circuits usually use BDDs. After a few steps of symbolic simulation, state set representation is converted from one para...
159
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
164
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
As a prevalent constraint, sharp slew rate is often required in circuit design which causes a huge demand for buffering resources. This problem requires ultra-fast buffering techn...