Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
This paper presents a new dependence language modeling approach to information retrieval. The approach extends the basic language modeling approach based on unigram by relaxing th...
Jianfeng Gao, Jian-Yun Nie, Guangyuan Wu, Guihong ...
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
Background: The continuous flow of EST data remains one of the richest sources for discoveries in modern biology. The first step in EST data mining is usually associated with EST ...
—A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random...
Mitrajit Chatterjee, Dhiraj K. Pradhan, Wolfgang K...