6926 search results - page 1111 / 1386 » A More Effective CEFF |
160
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
In this paper we describe how Network-on-Chip (NoC) will be the next major challenge to implementing complex and function-rich applications in advanced manufacturing processes at ...
173
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ICCD
2002
IEEE
16 years 3 months ago
2002
IEEE
With technology advancing toward deep submicron, leakage energy is of increasing concern, especially for large onchip array structures such as caches and branch predictors. Recent...
188
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ICCD
2001
IEEE
16 years 3 months ago
2001
IEEE
Abstract-- Scaling the minimum feature size of VLSI circuits to sub-quarter micron and its clock frequency to 2GHz has caused crosstalk noise to become a serious problem, that degr...
145
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
—To overcome the energy-efficiency limitations imposed by finite sub-threshold slope in CMOS transistors, this paper explores the design of integrated circuits based on nanoelect...
147
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...