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CORR
2010
Springer
34views Education» more  CORR 2010»
15 years 6 months ago
Statistical Modelling of ft to Process Parameters in 30 nm Gate Length Finfets
This paper investigates the effect of process variations on unity gain frequency (ft) in 30 nm gate length FinFET by performing extensive TCAD simulations. Six different geometric...
B. Lakshmi, R. Srinivasan
PPOPP
2009
ACM
16 years 7 months ago
Serialization sets: a dynamic dependence-based parallel execution model
This paper proposes a new parallel execution model where programmers augment a sequential program with pieces of code called serializers that dynamically map computational operati...
Matthew D. Allen, Srinath Sridharan, Gurindar S. S...
OSDI
2004
ACM
16 years 6 months ago
Using Magpie for Request Extraction and Workload Modelling
Tools to understand complex system behaviour are essential for many performance analysis and debugging tasks, yet there are many open research problems in their development. Magpi...
Paul Barham, Austin Donnelly, Rebecca Isaacs, Rich...
ICDE
2002
IEEE
102views Database» more  ICDE 2002»
16 years 8 months ago
Cost Models for Overlapping and Multi-Version B-Trees
Overlapping and multi-version techniques are two popular frameworks that transform an ephemeral index into a multiple logical-tree structure in order to support versioning databas...
Yufei Tao, Dimitris Papadias, Jun Zhang
DAC
2008
ACM
16 years 7 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...